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Module Tests

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preamp kept resetting. no cable bonded. Capacitance of Analog Cable ... Noise issue which might be related to preamp reset or other failure in the control sequence. ... – PowerPoint PPT presentation

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Title: Module Tests


1
Module Tests
  • Noise measurement using L0 prototype connected
    with only cable. ? capacitance of analog cable.
  • L0/L1 prototype modules being tested. The basic
    functionality working OK, however there are a
    few unresolved problems and misbehaviors.
  • Noise due to (?????) preamp reset.
  • BW dependence not completely same as expected.
  • Big (and the same size of) noise in first a few
    events.
  • Too clean (no noise) in the rest of events for
    loaded channel.
  • Many zero ADC counts. ? firmware or operation
    dependence.

2
Noise Measurement by the Prototype with only
cable connected
3
Noise Level (only cable bonded)
cable bonded
preamp kept resetting
no cable bonded
4
Capacitance of Analog Cable
  • Use RMS of pedestal distributions (not gaussian
    s).
  • RMS(bonded channel) 1.88 ADC 1320e.
  • RMS(no load) 0.93 ADC 650e.
  • Difference 670e.
  • ENC of SVX4 300 41C(pF)e.
  • Based on the slope above, 41C 670e.
    ? C 16.3pF.
  • Measurement for single cable by LCR meter
    15pF _at_1MHz,
    16pF_at_100kHz.

5
Noise SVX4 operation
close to pa_reset
far from pa_reset
FE clk
L1A
PA_reset
cal_sr
  • PRD2(refresh of reference cell) wrong in
    position???
  • Known effect closer the L1A, more noise. (I
    dont recommend pipeline depth 1 or even 2.)

6
Old Measurement of Noise
channel
bucket (pipeline cell)
7
Misbehaviors 1 (w/ cable only)
BW0
BW1
BW2
BW4
BW8
BW15
  • There is always high side tail.
  • BW0 unreasonable.

8
Misbehaviors 2 (w/ both cable and sensor)
Bonded both sensor and cable
HV off
No load
  • A few first events always noisy.
  • The rest is too less noisy.

9
100 events taken
1000 events taken
10
Misbehavior 3 (by the older firmware)
cal_inj mode
data mode
data mode (396ns)
  • There seems to be huge noise, but (see next
    slide)

11
No ADC counts in data
135.8671875 143.046875 152.21875 143.28125 141.5
144.2109375 0
0 146.015625 144.5 145.390625 143.09375 144.023437
5 143.890625 144.6875
144.34375 144.953125 143.0859375 148.2421875 143.9
140625 146.453125 143.1171875 140.4609375 144.6484
375 143.6875 143.4375 141.875
144.0078125 144.1015625 143.765625 145
.296875 143.375 144.9609375 143.75 145.1328125 143
.1875 141.9453125 143.0703125 0
0 149.140625 143.203125 155.1796875 143.2734375 13
9.96875 142.75 0
0 142.296875 144.0078125 147.4765625 143.46875
cal_inj mode
data mode
Avg. of chip 1 2
data mode (396ns)
12
Pedestal Shape (cal_inject mode)
rampped5
rampped6
Lower limit of ADC counts in usual condition
rampped4
rampped3
rampped1
rampped2
  • Note the fraction of zero.

13
Even Odd Effect?
  • The fraction of ADC0 events differs between even
    and odd channel. ? next page.

14
Raw ADC distributions
ch99
ch100
  • Be careful to study noise. RMS is not enough to
    catch a real noise effect. ? always better to
    look at raw ADC distributions.

15
SVX4 operation by SASEQ
end of acquire
start of acquire
cal_strobe
fixed time
arbitrary time
cal_inject mode
Data (or trigger) mode
cal_strobe in init mode in each event to reset
the pipeline position
fixed time
arbitrary time
new cal_inject mode
16
Summary
  • L0/L1 module prototype testing in progress.
  • Noise due to capacitive load by the analog cable
    is as expected. Capacitance 16pF in the setup.
  • Noise issue which might be related to preamp
    reset or other failure in the control sequence.
  • Some misbehaviors. ? mishandling of control
    sequence?
  • More works give us more puzzles/mystery
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