ASAM ODS in the NI Platform

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• ASAM ODS in the NI Platform
• Andreas Haub, National Instruments
• Andreas Krantz, National Instruments

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Base Elements of Your Test Data Scenario

• Unique Elements / Entity
• Properties / Attributes
• Relationships / Relations

• Tests
• ECE
• WHTC
• WHSC

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Within this structure you get a lot of data..

• Tests
• ECE
• WHTC
• WHSC

• Tests
• ECE
• WHTC
• WHSC

• Tests
• ECE
• WHTC
• WHSC

• Tests
• ECE
• WHTC
• WHSC

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Use Cases

• Tests
• ECE
• WHTC
• WHSC

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Slice the Data by using Views
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Live Demo with NI-DIAdem
28 Testbeds 150 Engineers 80 Users (Test
Engineers Desigers) 4000 Measurements 21000
Channels/Signals
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Test- and Data Management
TestStand DIAdem
LabVIEW
Measurement Studio
Special software
LabWindows/ CVI
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Come and see us at our booth

• LabVIEW and DIAdem talking ASAM ODS
• NI-Software NI-Hardware
• Talk to the Experts

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Contact Information

• Andreas Haub andreas.haub_at_ni.com
• Andreas Krantz andreas.krantz_at_ni.com
• Thomas Schönitz thomas.schnoenitz_at_ni.com
• Technical Support for ASAM-ODS questions related
  to NI-Products
• EuropeWalter Rick walter.rick_at_ni.com
• North-AmericaBrad Turpin brad.turpin_at_ni.com