Electrothermal modeling for Reliability Estimation

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Electro-thermal modeling for Reliability
Estimation
Gennady Balim, Vladimir Chervjakov, Andrei
Gornitski, Aleksandr Kuptsov, Vladimir Lyashev,
Michael Maksimov, Nikolai Merezhin, Vadim Popov,
Andrei Shulga
Taganrog State University of Radio Engineering,
Russia
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The goal
The basis

• The theory of non-equilibrium processes
• Dependence between reliability of power system
  elements and 1/f noise
• Results of circuit simulation
• Signal processing techniques

To evaluate the reliable operating time of an
electronic device at the earliest steps of a
design.
Simulation objects
Initial data
Electrical and electromechanical devices

• Schematics and drawings of the designed system
• Materials and parameters
• Operating conditions

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ESTIMATOR(structure chart)
VTB simulation of transient response
Computation of frequency parameters for the
circuit
Signal processing ofVTB-simulationresults
Computation of heat parameters
Calculation of the fluctuation intensity of energy
Estimate of reliable operating time
Calculation of energy values at failure
Notes
ESTIMATOR the specific VTB model for OHR
estimation
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The main drawbacks of the 2004 Estimator

• Used empirical formula for computing the
  intensity of frequency fluctuation. In 2005 we
  offer another approach based on threshold
  frequency estimations.
• Used Fast Fourier Transform for computation of
  frequency parameters too time consuming and
  inconvenient. In 2005 model we have replaced FFT
  with time-frequency analysis.

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Experiment numerical results
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Time-Frequency Analysis of filter
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Estimated operating time of filter
Actual values of reliable operating time will be
smaller, because of many phenomena that were not
considered, including technological defects,
users negligence, and others.
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Outlook for application of overheating to
Reliability Estimation

• The 2004-Estimator was based on empirical
  expression for intensity of low frequency energy
  fluctuation.
• We plan to develop a new ESTIMATOR based on
  threshold frequency estimations.
• It is supposed to also take into account some
  other phenomena like radiation damage, thermal
  cracks, generation-recombination noise, and
  others.
• We also think about estimating reliable operating
  time not only based on results of numerical
  experiments over mathematical models of devices
  but also as results of experiments over real
  devices using approach similar to HIL simulation.

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The end

• Thank you for attention!