Title: EM background tests of IP feedback hardware
1EM background tests of IP feedback hardware
Oxford (P. Burrows, C. Perry, G. Christian, T.
Hartin, H. Dabiri Khah, C. Clarke, C. Swinson, B.
Constance) Daresbury (A. Kalinin) SLAC (Mike
Woods, Ray Arnold, Steve Smith) KEK
- Christine Clarke
- Oxford University
- 24th September 2007
2FONT at ESA The ILC Environment
- The IP feedback BPM sits between the Beam
Calorimeter and the first extraction line quad. - This area has lots of low energy particles due to
interaction of ee- pairs and photons (from
beam-beam interaction) with IR material.
Low-Z mask
Beam Cal
IP Feedback BPM
Extraction Quad
3FONT at ESA Hits on striplines
- GEANT3 Simulations by Tony Hartin (Oxford) show
up to 105 particle hits per stripline - Are simulations correct down to low energies?
- Charges being added or removed from the BPM
causes errors (1pm per charge Steve Smith). - FONT requires resolution on the micron level.
4FONT at ESA Module
- Recreate the environment around the BPM
- (Match the particles entering the region)
- Match the materials in the region
- Constructed at Daresbury.
Low Z Mask
Beam Cal
Stripline BPM
Quad Pole face
5FONT at ESA Requirements
All charges at the ILC
- ILC conditions impossible to replicate but we can
identify the parts that matter- energies and
fluxes of particles that cause hits on BPM
striplines. - We require electrons and positrons of average 4
GeV impacting front face of module as well as the
original electron beam.
Low Z Mask
Charges that go on to cause hits on striplines
The charges that cause hits on the striplines
peak around 4 GeV
6FONT at ESA Method 1
- Ran tests at End Station A (ESA) at SLAC.
- Scanned the electron beam across the front face
of the module. - CCD camera to aid positioning beam spot on the
front face of the module. - A Low Flux Toroid monitored beam charge down to
106 electrons. - Ran at 28.5 GeV, 107 electrons beam charge.
Produced 15000 times more hits per stripline
than worst case ILC.
7FONT at ESA Method 1 Results
- Signals with the beam on the Low Z mask were
different from BPM stripline signal- suggestive
of secondary emission. - The signals caused by secondary emission were not
large enough to cause problems for the operation
of the IP BPM.
8FONT at ESA Method 1 Simulations
- Simulating these results in GEANT has had some
success (Tony Hartin). - Normal stripline response Secondary emission
Simulation (T. Hartin)
Real Data from ESA
9FONT at ESA Method 2
- Second method delivers both electrons and
positrons as a halo around the main electron beam
using thin radiators just upstream of module. - The energies of charges hitting the module do not
match. - GEANT simulations show this does not affect the
energy distribution of what hits the striplines. - Can make numbers match.
10FONT at ESA Method 2
- 3 aluminium foils used, 1, 3, 5 X0.
- Recorded 1000 stripline signals without foils.
- Recorded 1000 stripline signals with foils.
- With 5 X0 foil in, Produced 5000 times more
hits per stripline than worst case ILC.
11FONT at ESA Method 2 Results
- No change with foil in and foil out.
- Statistical errors on parameters (d and z)
greater than the difference between the foils in
and out. - Statistical error is 700 times smaller than the
value that constitutes a 1 micron error in
position measurement at the ILC.
d (AB)/(A-B)
A
z C/(A-B)
C
B
12FONT Summary
- IP Feedback BPM sits in a region where
backgrounds are present. - Created backgrounds and recorded stripline
behaviour. - Stripline signal shows secondary emission.
- Some success in understanding the exact form just
using GEANT3. - Signal is not large enough to cause problems with
micron-level position measurement at the ILC. - General
- Ability to simulate IR backgrounds.
- Other beamline elements can be tested there.
13(No Transcript)
14FONT at ESA Method 3 (no plans to use this
method)
- To match energies and fluxes, we propose Be
target in BSY. - We can select only 4 GeV electrons.
- We can fill the entire beampipe with electrons so
illuminating the whole front face of the module.
Collimators and optics control the shape. - We can change fluxes to match ILC backgrounds or
to make them a factor of ten worse. - We only have spray- no primary beam to measure.