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The IV Ramp Circuit for Langmuir Probe

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... to the plasma and the V/I characteristic is recorded using an oscilloscope. Data from the oscilloscope is then sent to a PC for further analysis. ... – PowerPoint PPT presentation

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Title: The IV Ramp Circuit for Langmuir Probe


1
The IV Ramp Circuit forLangmuir Probe
  • Yee Yue Fei
  • Techpos 04

2
Plasma
  • 4th state of matter.
  • Consist of Electrons ,ions and neutrals.
  • Temperature range from 0.1 eV several keV

3
Important Plasma Parameter
  • Electron, ion and neutral temperature
  • Charge density
  • Plasma potential

4
Plasma Diagnostic Techniques
  • Interferometer (Optical Microwave)
  • Spectroscopy
  • Spectral Intensity
  • Langmuir Probe

5
A Simple Langmuir Probe Setup
  • Ramp Voltage is applied to the plasma and the V/I
    characteristic is recorded using an oscilloscope.
  • Data from the oscilloscope is then sent to a PC
    for further analysis.
  • Ion as well as electron temp. and density can be
    found from V/I.
  • These characteristics are important for setting
    the plasma process parameters.

6
Probe Working Principle
I
Electron saturation
Ion saturation
Vp
Vf
V
7
Objective
  • To design a high speed ramp voltage circuit for
    Langmuir probe supply.
  • To diagnose a continuous microwave plasma using
    the developed Langmuir probe system.

8
Building Block of Langmuir Probe
  • Probe
  • Probe Ramp Voltage Supply
  • Data Acquisition Device

9
The Probe
  • Essentially a metal, normally tungsten, that is
    inserted in a Plasma for diagnostics purposes.
  • Normally insulated by mica or quartz, exposing
    only small section of tips to the Plasma.

10
Circuit Block Diagram
  • Consists of 3 parts.
  • Generator
  • Amplifier
  • Sensing conditioning

11
Circuit diagram
12
Circuit diagram
  • Current sensing using a resistor.
  • Buffer invert by opamp.
  • Fed to DAQ together with respective probe voltage
    for analysis.
  • Offset is nulled by resistor.
  • Ground referance, output can be feed directly to
    DAQ.

13
DAQ Design
  • NI DAQ card is used.
  • Voltage signal is attenuated using NI SCC-A10
  • Current signal is fed directly.
  • Analysis and result displayed using LabView.
  • Ramp Gen. is float by current sensing resistor.

14
Result Discussion
15
Circuit Performance
Circuit tested with 300W resistor.
16
Specification of Circuit
17
LabView screenshot
18
(No Transcript)
19
Result for 50mTorr Argon plasma
Te 11eV
ne 5e10 /cm³
20
Conclusion
  • A fully functional and highly customizable
    Langmuir Probe driving circuit is developed.
  • Various control and interfacing options built-in
    allow the circuit to suit wider application.

21
Acknowledgement
  • The work at Uniten is financially supported by
    IRPA,
  • Grand No 09-99-03-0014-EA-001.
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