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In the highly competitive semiconductor manufacturing industry, wafer map inspection is a crucial step in ensuring product quality and improving yield. This process, which involves identifying defects in silicon wafers, traditionally depends on manual, labor-intensive techniques. However, with the rise of machine learning and artificial intelligence, deep learning methods have emerged as promising alternatives to these traditional approaches.

(1) Courant Institute of Mathematical Sciences, New York University ... Reduce processing time. Estimate delays between path planning and actuation. ...