Title: PowerPoint Presentation Author: College of Agriculture Last modified by: David Hochreiter Created Date: 4/17/2001 2:23:21 PM Document presentation format
Semiconductor manufacturing and semiconductor yield management is becoming more complex due to relentless advancements in technology. The ability to control critical dimensions is becoming increasingly important yet challenging as manufacturing processes continue to evolve. New production processes and variable machine configurations contribute to the complexity, generating high-dimensional, multi-collinear data that are difficult to analyze.
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