Title: Enhancing Wafer Map Inspection Process in Semiconductor Manufacturing Using Deep Learning - PowerPoint PPT Presentation

Description: In the highly competitive semiconductor manufacturing industry, wafer map inspection is a crucial step in ensuring product quality and improving yield. This process, which involves identifying defects in silicon wafers, traditionally depends on manual, labor-intensive techniques. However, with the rise of machine learning and artificial intelligence, deep learning methods have emerged as promising alternatives to these traditional approaches. – PowerPoint PPT presentation