File to download:
Title: Adaptive On-Chip Test Strategies for Complex Systems - PowerPoint PPT Presentation
Description: ... Logic ATE, Memory ATE, Analog ATE (Double/Triple Insertion) ... Requires deep tester memory for scan I/O pins. Slow test with long scan chains. External ... – PowerPoint PPT presentation
Download instruction:
The PPT version of this presentation was uploaded from an external web page or resource. We
cannot guarantee that the PPT file is still there nor can we verify that it is safe for you to
download. That said, if you whish to download it, please copy the URL below, and paste it into
the address bar of your browser.
PPT URL: https://pld.ttu.ee/~raiub/REASON_tutorial/analog_test/L1_Stopjakova.ppt
